The ZEISS Gemini 450 is a high-resolution field emission SEM optimized for low-kV imaging and advanced analytical performance. The system supports secondary electron (SE) imaging and BSE/BSD detection providing compositional contrast as well as orientation and channeling contrast, enabling sensitivity to both chemical and crystallographic variations.

The instrument is equipped with EDS for elemental analysis, EBSD for crystallographic analysis, including crystal structure identification, grain orientation mapping, misorientation analysis, and texture measurements, and an Oxford Instruments Unity BEX detector. BEX (Backscattered Electron and X-ray imaging) provides simultaneous acquisition of BSE contrast and elemental (X-ray) information during imaging. The system also includes the EXTREM detector for enhanced light-element detection and mapping.