The ZEISS Sigma 300 field emission SEM is configured for integrated imaging, elemental analysis, and crystallographic characterization. The instrument provides secondary electron (SE) imaging for surface morphology and backscattered electron (BSE) imaging for compositional (Z-contrast) and orientation/channeling contrast, enabling detailed analysis of polycrystalline and heterogeneous microstructures.

Analytical capabilities include EDS for elemental analysis and mapping, WDS for improved spectral resolution and separation of overlapping peaks or detection of minor elements, and EBSD for crystal structure identification, grain orientation mapping, misorientation analysis, and texture characterization.